Resistivity Measurement System Suite, 4-Point Probe
Description
The objective of this acquisition is to provide the Department with a comprehensive, multi-environment resistivity measurement capability. This suite will support mission-critical analysis of semiconductor materials, thin films, and conductive polymers across a full range of physical and thermal conditions. This Amendment to the Solicitation (SF30.pdf) is to reopen the solicitation to 9/18/2026 at 1500 EST due to a need for an update to the Performance Work Statement. Please see attached Updated Performance Work Statement (PWS) (Updated PWS Tech Spec.pdf) for more specific technical information.
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