Back to search
SAM.govRef 1333ND24PNB030428

CHIPS XAFS and Diffraction, Silicon Drift Detector

NNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY logo
Contracting authorityNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
AwardGoodsNAICS 334413
Contract value$798,300
PublishedMar 20, 2026
LocationUpton, NY

Description

Awarded on a sole source basis in accordance with attached redacted justification for other than full and open competition.

The rest of this notice

The tender documents, the buyer's named contact and the award history for this notice are free. Create an account to open the full record.

  • Download the tender documents
  • Contact the buyer directly
  • See who won, and for how much
  • Get alerts for tenders like this one
Create a free account

Free — no card, no trial clock.

Get new contracts matching NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY by email — free, no card needed.
This creates a free account. By continuing you agree to our terms and privacy policy. Unsubscribe any time.

Guides for bidders

New to public sector tendering? These short guides explain how the process works.

The Bidding ProcessFramework Agreements & Dynamic MarketsProcurement Act 2023